structural health monitoring and wireless damage detection with piezoelectric wafer active sensors

Gaurav Bharadwaj,Nikhil Swami,Ritu Sharma

Published in International Journal of Advanced Research in Electronics, Communication & Instrumentation Engineering and Development

ISSN: 2347 -7210          Impact Factor:1.9         Volume:2         Issue:3         Year: 26 December,2014         Pages:29-35

International Journal of Advanced Research in Electronics, Communication & Instrumentation Engineering and Development

Abstract

In this paper we review the state of the art in an emerging new technology: embedded ultrasonic non-destructive evaluation (NDE). Embedded ultrasonic NDE permits active structural health monitoring, i.e. the on-demand interrogation of the structure to determine its current state of structural health. The enabling element of embedded ultrasonic NDE is the piezoelectric wafer active sensor (PWAS). Piezoelectric wafer active sensors (PWAS) are lightweight and inexpensive enablers for a large class of structural health monitoring (SHM) and damage detection applications. PWAS are multi-mode, i.e., they can be used for damage detection using both active and passive methods and utilizing both traveling guided waves (acousto-ultrasonics) as well as standing waves (vibration) techniques. PWAS have several applications in the areas of: (a) embedded guided-wave ultrasonics, e.g., pulse-echo and phased arrays; (b) high-frequency modal sensing, i.e., the electro-mechanical (E/M) impedance method. The paper ends with conclusions and suggestions for further work.

Kewords

Structural health monitoring; SHM; piezoelectric wafer active sensors; PWAS; electromechanical impedance; EMIS; acousto-ultrasonics; guided waves; Lam

Reference

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